2010-2011 Catalog 
    
    Jul 24, 2024  
2010-2011 Catalog [ARCHIVED CATALOG]

Add to Portfolio (opens a new window)

ECE 5320 - Fault Detection & Design for Testability

3 Credits (Minimum) 3 Credits (Maximum)

Stuck-at fault modeling. Test generation for combinational circuits-Boolean difference, D-algorithm, Podem, Fan, critical path. Fault dominance and equivalence. Test generation for synchronous sequential circuits. Cost functions used in test generation. Fault simulation. Basics for design for testability. Prer., ECE 3430 or equivalent. Meets with ECE 4320.



Add to Portfolio (opens a new window)