|
|
Dec 07, 2024
|
|
ECE 5320 - Fault Detection & Design for Testability3 Credits (Minimum) 3 Credits (Maximum)
Stuck-at fault modeling. Test generation for combinational circuits-Boolean difference, D-algorithm, Podem, Fan, critical path. Fault dominance and equivalence. Test generation for synchronous sequential circuits. Cost functions used in test generation. Fault simulation. Basics for design for testability. Prer., ECE 3430 or equivalent. Meets with ECE 4320.
Add to Portfolio (opens a new window)
|
|
|