2008-2009 Catalog 
    
    Apr 30, 2024  
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2008-2009 Catalog [ARCHIVED CATALOG]

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ECE 6410 - Advanced Topics in Testing

3 Credits
Bridging faults and quiescent-current testing. BIST PLAs, RAMs, ROMs. Delay-faults including gate-delay/path-delay models. Logic level and system-level fault diagnosis.Prerequisites: ECE 4320/5320.
Meets with ECE 5410.


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