ECE 5320 - Fault Detection & Design for Testability

3 Credits

Stuck-at fault modeling. Test generation for combinational circuits-Boolean difference, D-algorithm, PODEM, FAN, critical path. Fault dominance and equivalence. Test generation for synchronous sequential circuits. Cost functions used in test generation. Fault simulation. Basics for design for testability.Prerequisites: ECE 3430 or equivalent.
Meets with ECE 4320.