ECE 5410 - Advanced Topics in Testing

3 Credits (Minimum) 3 Credits (Maximum)

Bridging faults and quiescent-current testing. BIST PLAs, RAMs, ROMs. Delay-faults and gate-delay/path-delay models. Logic-level and system-level fault diagnosis. Prer., ECE 4320/5320. Meets with ECE 6410.