2011-2012 Catalog 
    
    Jul 03, 2022  
2011-2012 Catalog [ARCHIVED CATALOG]

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ECE 6410 - Advanced Topics in Testing

3 Credits (Minimum) 3 Credits (Maximum)

Bridging faults and quiescent-current testing. BIST PLAs, RAMs, ROMs. Delay-faults including gate-delay/path-delay models. Logic level and system-level fault diagnosis. Prer., ECE 4320/5320. Meets with ECE 5410.



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