2010-2011 Catalog 
    
    Apr 23, 2024  
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2010-2011 Catalog [ARCHIVED CATALOG]

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ECE 5320 - Fault Detection & Design for Testability

3 Credits (Minimum) 3 Credits (Maximum)
Stuck-at fault modeling. Test generation for combinational circuits-Boolean difference, D-algorithm, Podem, Fan, critical path. Fault dominance and equivalence. Test generation for synchronous sequential circuits. Cost functions used in test generation. Fault simulation. Basics for design for testability. Prer., ECE 3430 or equivalent. Meets with ECE 4320.


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