2010-2011 Catalog 
    
    Apr 20, 2024  
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2010-2011 Catalog [ARCHIVED CATALOG]

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ECE 4320 - Fault Detection & Design for Testability

3 Credits (Minimum) 3 Credits (Maximum)
Stuck-at fault modeling. Test generation for combinational circuits-Boolean difference, D algorithm, PODEM, FAN, critical path. Fault dominance and equivalence. Test generation for synchronous sequential circuits. Cost functions used in test generation. Fault simulation. Basics of design for testability. Prer., ECE 3430 or equivalent. Meets with ECE 5320.


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