2009-2010 Catalog 
    
    Mar 28, 2024  
2009-2010 Catalog [ARCHIVED CATALOG]

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ECE 5410 - Advanced Topics in Testing

3 Credits

Bridging faults and quiescent-current testing. BIST PLAs, RAMs, ROMs. Delay-faults and gate-delay/ path-delay models. Logic-level and system-level fault diagnosis.Prerequisites: ECE 4320/5320
Meets with ECE 6410



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