2009-2010 Catalog 
    
    Apr 18, 2024  
HELP
2009-2010 Catalog [ARCHIVED CATALOG]

Add to Portfolio (opens a new window)

ECE 4320 - Fault Detection & Design for Testability

3 Credits
Stuck-at fault modeling. Test generation for combinational circuits-Boolean difference, D algorithm, PODEM, FAN, critical path. Fault dominance and equivalence. Test generation for synchronous sequential circuits. Cost functions used in test generation. Fault simulation. Basics of design for testability.Prerequisites: ECE 3430 or equivalent
Meets with ECE 5320


Add to Portfolio (opens a new window)
Catalog Navigation
  Catalog Home
  How To Use Your UCCS Catalog
  Academic Calendar
  From the Chancellor
  Mission, Vision, and Goals
  Admissions
  Academic Policies, Registration, and Records
  Academic Advising/Student Success/Careers
  Expenses
  Financial Aid/Student Employment
  Student Life and Services
  Student Rights and Responsibilities
  Administration and Faculty
  The Graduate School
  College of Business and Administration
  College of Education
  College of Engineering and Applied Science
  College of Letters, Arts, and Sciences
  Beth-El College of Nursing and Health Sciences
  School of Public Affairs
  Programs
  Courses
  My Portfolio